Main Article Content
Thin films of Cu2ZnSnS4 (CZTS) with different molar concentrations of thiourea were prepared on glass substrates using spray pyrolysis technique. The structural, optical and electrical properties of the CZTS thin films were investigated using X-ray diffraction (XRD), UV-vis spectroscopy and sheet resistance measurement respectively. The XRD analysis demonstrated the polycrystalline nature of the CZTS. We observed better crystallanity in CZTS film prepared with thiourea concentration of 0.20 M and optical band gap value at this concentration was observed to be 1.60 eV. The optical study showed that band gap increased with an increase in thiourea concentration. The sheet resistance of the sample prepared with 0.20 M concentration of thiourea was 10.73 Kohm/sq.