Effect of Thiourea Concentration on Structural, Optical and Electrical Properties of Cu2ZnSnS4 Thin Films Prepared by using Spray Pyrolysis

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Biplav Dahal
Leela Pradhan Joshi
Satyendra N. Pandey
Shankar Prasad Shrestha

Abstract

Thin films of Cu2ZnSnS4 (CZTS) with different molar concentrations of thiourea were prepared on glass substrates using spray pyrolysis technique. The structural, optical and electrical properties of the CZTS thin films were investigated using X-ray diffraction (XRD), UV-vis spectroscopy and sheet resistance measurement respectively. The XRD analysis demonstrated the polycrystalline nature of the CZTS. We observed better crystallanity in CZTS film prepared with thiourea concentration of 0.20 M and optical band gap value at this concentration was observed to be 1.60 eV. The optical study showed that band gap increased with an increase in thiourea concentration. The sheet resistance of the sample prepared with 0.20 M concentration of thiourea was 10.73 Kohm/sq.

Keywords:
CZTS thin films, spray pyrolysis, X-ray diffraction, thiourea concentration

Article Details

How to Cite
Dahal, B., Pradhan Joshi, L., N. Pandey, S., & Prasad Shrestha, S. (2017). Effect of Thiourea Concentration on Structural, Optical and Electrical Properties of Cu2ZnSnS4 Thin Films Prepared by using Spray Pyrolysis. Asian Journal of Chemical Sciences, 2(4), 1-8. https://doi.org/10.9734/AJOCS/2017/34313
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Original Research Article